Sr. Defect Engineer

Position Summary: SkyWater Technology’s Defect Team is seeking an innovative Defect Engineer with a strong background in data science/analytics and semiconductor processing. In this role, you will be the primary owner of the quality and integrity of defect data generated from our defect metrology tools. You will drive yield improvements by ensuring high-quality data collection from these advanced tools, developing novel defect recipes tailored for complex, non-traditional processes, and integrating new defect metrology tools and technologies into our operations. This role involves close collaboration with equipment engineers, defect technology owners, and other key stakeholders to develop innovative inspection methodologies, validate new tool data, and implement robust data validation protocols that support our yield improvement initiatives. Responsibilities: Data Quality Ownership: Serve as the primary custodian for the quality, accuracy, and consistency of defect data generated from our defect metrology tools. Implement and maintain rigorous data validation protocols, continuously monitoring data integrity to support reliable process insights. Novel Defect Recipe Development: Design, develop, and implement innovative defect inspection recipes specifically for our defect metrology tools to address challenges in complex, non-traditional semiconductor processes. Leverage deep technical expertise to tailor recipes for emerging technologies, ensuring optimal defect detection and classification. Integration of New Defect Metrology Tools: Identify, evaluate, and introduce new types of defect metrology tools to enhance process monitoring and yield improvement. Collaborate with equipment engineers, defect technology owners, vendors, and cross-functional teams to pilot, qualify, and integrate novel defect metrology tools while ensuring consistent data quality. Strategic Defect Reduction Roadmap: Develop and execute a comprehensive defect reduction roadmap that aligns with yield improvement objectives through precise data analysis and innovative defect recipe formulation. Collaborative Data Analysis & Process Improvement: Partner with equipment engineers, defect technology owners, process engineers, and fab operations to interpret defect metrology data, integrate findings into process control systems, and drive actionable insights for yield enhancements. Utilize statistical process control (SPC) and advanced data analytics (using tools such as Python, SQL, JMP, etc.) to identify trends, diagnose root causes, and recommend effective corrective actions. System Integration & Reporting: Work with defect management systems (e.g., Synopsis Odyssey, Onto Discover) to streamline data capture, reporting, and trend analysis across the fab, ensuring comprehensive visibility into defect patterns generated by our defect metrology tools. Required Qualifications: Education: Bachelor’s degree in Electrical Engineering, Materials Science, Physics, Data Science, or a related technical field. Experience: Minimum 3 years of relevant work experience in semiconductor manufacturing, with a focus on defect analysis, defect metrology data interpretation, or yield improvement initiatives. Demonstrated success in developing and implementing innovative defect recipes or advanced data validation protocols for complex processes. Experience or exposure to integrating new defect metrology tools is highly desirable. Technical Expertise: Strong understanding of semiconductor processing, defect metrology, and inspection methodologies. Proficiency in statistical process control (SPC) and data mining/analysis techniques. Experience with data analysis tools (e.g., Python, SQL, JMP) is highly desirable. Familiarity with defect management systems is a plus. Soft Skills: Excellent communication and collaboration skills, with a proven ability to work effectively in cross-functional teams. Innovative problem-solving capabilities with a proactive approach to addressing complex, non-traditional challenges. High attention to detail and strong organizational skills in managing defect metrology data quality and process improvement projects. US Citizenship Required:This position requires the holding of or the ability to obtain government security clearance, which necessitates U.S. Citizenship.