Responsibilities

· Develop production, qualification, and characterization test programs for digital, analog, mixed-signal devices on ATE (Automatic Test Equipment) using Advantest 93K, Teradyne Uflex or other major test platforms.

· In charge of test pattern conversion and verification prior to silicon to ensure “First Time Right Vector” for smooth ATE bring-up.

· In charge of test hardware bring-up (probe card and load board) to meet the test specifications.

· Own First-Si test pattern bring-up, and collaborate with Product Engineering, DfT, and IC design to efficiently debug any failures and implement optimal solutions.

· Define test requirements & test limits, ensuring the correct levels of test coverage, and devise strategies to optimize test time.

· Drive ATE to System level correlation to implement relevant voltage guard-bands.

· Work cross functionally on failure analysis and debug during NPI phase and feedback to test strategy to ensure high quality standards

Requirements

· Excellent skills in problem solving, written and verbal communication, excellent organization skills, and highly self-motivated.

· Minimum of 10-12 years of ATE experience developing test programs for server, client/mobile, or HPC products.

· Strong understanding of hardware design requirements (CPM/IBIS models, SI/PI simulation) for probe-card, load-board, burn-in boards.

· Hands-on experience with ATE test equipment (Advantest SMT8 preferred) writing Scan / Mbist / PHY tests, developing product binning test methods, secure manufacturing flows.

· Experience in leading a team of test engineers and managing OSATs highly desired.

· Prior DfT experience is highly desired.

Education and Experience

· Bachelor’s or Master’s Degree in technical subject area.